Title :
Elementary magnetization processes in a low-anisotropy circular thin film disk
Author :
Rührig, Manfred ; Bartsch, Wolfgang ; Vieth, Michael ; Hubert, Alex
Author_Institution :
Inst. fur Werkstoffwissenschaften, Erlangen-Nurnberg Univ., West Germany
fDate :
9/1/1990 12:00:00 AM
Abstract :
Domain observations during the magnetization process of small circular-shaped high-Js multilayered thin-film elements were made using a high-resolution Kerr technique in addition to a digitally enhanced image-processing system. In order to check recent theoretical predictions, the authors determined the magnetization distribution of some typical domain patterns which can be observed during the magnetization process. In some cases the magnetization process becomes irreversible and other more complicated remanent domain patterns may occur. Domains on circular thin-film elements are found to agree in their basic behavior with theoretical predictions for zero-anisotropy elements if the ground state consists of a simple circular magnetization pattern. The formation of a c-shaped domain wall and its position as a function of an applied field agree well with theory. This is true even though the present samples have a nonvanishing uniaxial anisotropy and the circular domain pattern is favored only due to a stress-induced edge anisotropy. Complications arise during and after magnetization along the hard axis of the uniaxial anisotropy. Some of the very attractive metastable states which can be generated in this way have been analyzed in detail
Keywords :
Kerr magneto-optical effect; magnetic domain walls; magnetic domains; magnetic thin film devices; magnetic thin films; magnetisation; Fe-FeNi; c-shaped domain wall; digitally enhanced image-processing system; domain patterns; high-resolution Kerr technique; low-anisotropy circular thin film disk; magnetization processes; metastable states; multilayered thin-film elements; remanent domain patterns; stress-induced edge anisotropy; uniaxial anisotropy hard axis; zero-anisotropy elements; Anisotropic magnetoresistance; Demagnetization; Magnetic films; Magnetization processes; Magnetostriction; Saturation magnetization; Shape; Tensile stress; Thin film sensors; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on