DocumentCode :
868023
Title :
Phase-shifting masks gain an edge
Author :
Lin, B.J.
Volume :
9
Issue :
2
fYear :
1993
fDate :
3/1/1993 12:00:00 AM
Firstpage :
28
Lastpage :
35
Abstract :
The potential, working principles, and approaches in phase shifting masks for optical lithography are discussed. The tradeoffs of each approach, and fabrication, inspection, repair, and tolerances are considered. It is feasible to use the phase shifting technology to improve optical lithography to 0.18- mu m feature size with k/sub 1/=0.35, lambda =248 nm, and NA=0.5. Further resolution improvements are still possible, but much development is required for making phase shifting masks a manufacturing reality.<>
Keywords :
masks; photolithography; 0.18 micron; fabrication; inspection; optical lithography; phase shifting masks; repair; resolution improvements; tolerances; Focusing; Lithography; Optical films; Optical imaging; Optical refraction; Optical sensors; Optical variables control; Refractive index; Resists; Shape;
fLanguage :
English
Journal_Title :
Circuits and Devices Magazine, IEEE
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/101.200850
Filename :
200850
Link To Document :
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