DocumentCode :
868107
Title :
Built-in-test, continued
Author :
Rassa, Bob
Volume :
5
Issue :
4
fYear :
2002
Firstpage :
8
Lastpage :
9
Keywords :
Aerospace electronics; Capability maturity model; Circuit faults; Instrumentation and measurement; Manufacturing processes; Military aircraft; Process control; Programming; Software systems; Systems engineering and theory;
fLanguage :
English
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
Publisher :
ieee
ISSN :
1094-6969
Type :
jour
DOI :
10.1109/MIM.2002.1048977
Filename :
1048977
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=868107
