• DocumentCode
    868486
  • Title

    Microplasma breakdown in high-voltage p--n junctions

  • Author

    Maddex, K.A. ; Young, M.R.P.

  • Author_Institution
    Texas Instruments Ltd., Bedford, UK
  • Volume
    2
  • Issue
    4
  • fYear
    1966
  • fDate
    4/1/1966 12:00:00 AM
  • Firstpage
    129
  • Lastpage
    130
  • Abstract
    The voltage-breakdown characteristics of controlled-avalanche junctions demonstrate the presence of microplasmas whose bistable current-switching properties are described. Microplasmas are exhibited by both diffused and alloyed junctions. The relationship between the breakdown voltage of the first microplasma with temperature for 1500--1800 V junctions is similar to that reported for 7--128 V junctions.
  • Keywords
    electric breakdown; p-n junctions; plasma; semiconductor junctions; switching;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19660102
  • Filename
    4206350