Title :
Nanosecond breakdown time lags in a dielectric liquid
Author :
Beddow, A.J. ; Brignell, J.E.
Author_Institution :
Northampton College of Advanced Technology, Department of Electrical and Electronic Engineering, London, UK
fDate :
4/1/1966 12:00:00 AM
Abstract :
Measurement has been made of breakdown time lags in n hexane at high stresses, and values of the order of 5ns have been obtained. The results support an earlier hypothesis that the formative time lag is normally distributed, in contrast with the recent findings of Rudenko and Tsvetkov.
Keywords :
dielectric liquids; electric breakdown; insulation testing;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19660115
