• DocumentCode
    868621
  • Title

    Nanosecond breakdown time lags in a dielectric liquid

  • Author

    Beddow, A.J. ; Brignell, J.E.

  • Author_Institution
    Northampton College of Advanced Technology, Department of Electrical and Electronic Engineering, London, UK
  • Volume
    2
  • Issue
    4
  • fYear
    1966
  • fDate
    4/1/1966 12:00:00 AM
  • Firstpage
    142
  • Lastpage
    143
  • Abstract
    Measurement has been made of breakdown time lags in n hexane at high stresses, and values of the order of 5ns have been obtained. The results support an earlier hypothesis that the formative time lag is normally distributed, in contrast with the recent findings of Rudenko and Tsvetkov.
  • Keywords
    dielectric liquids; electric breakdown; insulation testing;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19660115
  • Filename
    4206459
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=868621