Title :
Some low-leakage properties of silicon junction field-effect transistors
Author_Institution :
G. & E. Bradley Ltd., London, UK
fDate :
4/1/1966 12:00:00 AM
Abstract :
Factors governing the direct gate current in silicon field-effect transistors are reviewed, and a mode of operation which results in zero d.c. gate leakage is described. This leads to the postulation of a new d.c. equivalent circuit for the field-effect-transistor gate.
Keywords :
equivalent circuits; leakage currents; transistors;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19660117