DocumentCode :
868634
Title :
Some low-leakage properties of silicon junction field-effect transistors
Author :
Ettinger, G.M.
Author_Institution :
G. & E. Bradley Ltd., London, UK
Volume :
2
Issue :
4
fYear :
1966
fDate :
4/1/1966 12:00:00 AM
Firstpage :
145
Lastpage :
146
Abstract :
Factors governing the direct gate current in silicon field-effect transistors are reviewed, and a mode of operation which results in zero d.c. gate leakage is described. This leads to the postulation of a new d.c. equivalent circuit for the field-effect-transistor gate.
Keywords :
equivalent circuits; leakage currents; transistors;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19660117
Filename :
4206477
Link To Document :
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