DocumentCode
868634
Title
Some low-leakage properties of silicon junction field-effect transistors
Author
Ettinger, G.M.
Author_Institution
G. & E. Bradley Ltd., London, UK
Volume
2
Issue
4
fYear
1966
fDate
4/1/1966 12:00:00 AM
Firstpage
145
Lastpage
146
Abstract
Factors governing the direct gate current in silicon field-effect transistors are reviewed, and a mode of operation which results in zero d.c. gate leakage is described. This leads to the postulation of a new d.c. equivalent circuit for the field-effect-transistor gate.
Keywords
equivalent circuits; leakage currents; transistors;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19660117
Filename
4206477
Link To Document