• DocumentCode
    868634
  • Title

    Some low-leakage properties of silicon junction field-effect transistors

  • Author

    Ettinger, G.M.

  • Author_Institution
    G. & E. Bradley Ltd., London, UK
  • Volume
    2
  • Issue
    4
  • fYear
    1966
  • fDate
    4/1/1966 12:00:00 AM
  • Firstpage
    145
  • Lastpage
    146
  • Abstract
    Factors governing the direct gate current in silicon field-effect transistors are reviewed, and a mode of operation which results in zero d.c. gate leakage is described. This leads to the postulation of a new d.c. equivalent circuit for the field-effect-transistor gate.
  • Keywords
    equivalent circuits; leakage currents; transistors;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19660117
  • Filename
    4206477