Title :
160 Gbit/s error-free demultiplexing by ultrafast optical gate monolithically integrating photodiode and electroabsorption modulator
Author :
Kodama, S. ; Yoshimatsu, T. ; Ito, T. ; Ito, H. ; Ishibashi, Takayuki
Author_Institution :
NTT Photonics Labs., NTT Corp., Kanagawa, Japan
fDate :
11/21/2002 12:00:00 AM
Abstract :
160 Gbit/s error-free demultiplexing operation of a novel ultrafast optical gate is reported, that monolithically integrates a uni-travelling-carrier photodiode and a travelling-wave electroabsorption modulator. An on/off ratio of 17 dB and a receiver sensitivity of -23.3 dBm at a bit error rate of 10-9 have been achieved.
Keywords :
demultiplexing; digital communication; electro-optical devices; electroabsorption; optical communication equipment; optical logic; photodiodes; time division multiplexing; 160 Gbit/s; TDM; bit error rate; demultiplexing operation; electro-optic gates; error-free demultiplexing; on/off ratio; optical communication systems; photodiode; receiver sensitivity; travelling-wave electroabsorption modulator; ultrafast optical gate; uni-travelling-carrier photodiode;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20021085
