• DocumentCode
    869016
  • Title

    Magnetics and microstructure of sputtered Ni80Fe20 /SiO2 multilayer films

  • Author

    Russak, Michael A. ; Jahnes, Christopher V. ; Re, Mark E. ; Webb, Rucknell C. ; Mirzamaani, S. Mohamaad

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    26
  • Issue
    5
  • fYear
    1990
  • fDate
    9/1/1990 12:00:00 AM
  • Firstpage
    2332
  • Lastpage
    2334
  • Abstract
    Multilayered Ni80Fe20/SiO2 films have been produced by sputter deposition. The effects of lamination on the bulk magnetic properties, microstructure, and high-frequency permeability of stacks with various Ni80Fe20 and SiO2 thicknesses were investigated. In general, laminated films with a total magnetic thickness of 1.5 μm had significantly lower Hc and extended frequency response, compared to unlaminated films of the same magnetic thickness. In addition, the impact of lamination on domain configuration of yoke-shaped structures was determined, and excellent agreement with micromagnetic theoretical prediction was obtained
  • Keywords
    ferromagnetic properties of substances; iron alloys; magnetic permeability; magnetic thin films; nickel alloys; silicon compounds; sputtered coatings; superlattices; Ni80Fe20-SiO2; bulk magnetic properties; frequency response; high-frequency permeability; magnetic thickness; micromagnetic theoretical prediction; microstructure; sputter deposition; yoke-shaped structures; Couplings; Grain size; Iron; Laminates; Magnetic films; Magnetic multilayers; Magnetostatics; Microstructure; Sputtering; Substrates;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.104922
  • Filename
    104922