مرکز منطقه ای اطلاع رساني علوم و فناوري - A simple derivation for the stability criterion of linear active two-ports

DocumentCode :

869095

Title :

A simple derivation for the stability criterion of linear active two-ports

Author :

Ku, W.H.

Volume :

Issue :

fYear :

1965

fDate :

3/1/1965 12:00:00 AM

Firstpage :

310

Lastpage :

311

Keywords :

Capacitance measurement; Capacitors; Conductive films; Impedance; Insulation; Nitrogen; Silicon; Stability criteria; Substrates; Transistors;

fLanguage :

English

Journal_Title :

Proceedings of the IEEE

Publisher :

ieee

ISSN :

0018-9219

Type :

jour

DOI :

10.1109/PROC.1965.3707

Filename :

1445637

Link To Document :