• DocumentCode
    869250
  • Title

    Burst noise of silicon planar transistors

  • Author

    Giralt, G. ; Martin, J.C. ; Mateu-Perez, F.X.

  • Author_Institution
    Université de Toulouse, Laboratoire de Génie Ã\x89lectrique, Toulouse, France
  • Volume
    2
  • Issue
    6
  • fYear
    1966
  • fDate
    6/1/1966 12:00:00 AM
  • Firstpage
    228
  • Lastpage
    230
  • Abstract
    An important random phenomenon has been observed on low-level silicon planar transistors which has the aspect of a low-frequency squarewave of constant magnitude and random frequency. The step magnitude depends on temperature and biasing current; their probability of duration may be approached by a random Poisson process.
  • Keywords
    noise; transistors;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19660194
  • Filename
    4206875
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=869250