• DocumentCode
    869754
  • Title

    Single Event-Induced Instability in Linear Voltage Regulators

  • Author

    Adell, P.C. ; Witulski, A.F. ; Schrimpf, R.D. ; Marec, R. ; Pouget, V. ; Calvel, P. ; Bezerra, F.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN
  • Volume
    53
  • Issue
    6
  • fYear
    2006
  • Firstpage
    3506
  • Lastpage
    3511
  • Abstract
    SET-induced oscillations were measured on a stable linear-regulator that uses the LM124 op-amp in its regulation block. Simulations showed that single events act as stimuli that initiate a large-signal oscillation in the LM124 differential amplifier and compensation capacitor path. Laser testing validated the analysis and confirmed that transistors connected to the compensation capacitor are the most vulnerable
  • Keywords
    differential amplifiers; operational amplifiers; radiation effects; transistors; voltage regulators; LM124 op-amp; SET-induced oscillations; compensation capacitor path; differential amplifier; laser testing; stable linear-voltage regulator; transistors; Analog integrated circuits; Application specific integrated circuits; Capacitors; Circuit simulation; Circuit testing; Frequency measurement; Laboratories; Operational amplifiers; Regulators; Voltage; Linear voltage regulator; Single Event Oscillation; macro-model;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2006.886214
  • Filename
    4033182