• DocumentCode
    869883
  • Title

    On impedance evaluation in feedback circuits

  • Author

    Corsi, Francesco ; Marzocca, Cristoforo ; Matarrese, Gianvito

  • Author_Institution
    Departimento di Elettrotecnica ed Elettronica, Politecnico di Bari, Italy
  • Volume
    45
  • Issue
    4
  • fYear
    2002
  • fDate
    11/1/2002 12:00:00 AM
  • Firstpage
    371
  • Lastpage
    379
  • Abstract
    One of the main benefits of negative feedback is the ability to control the impedances in linear active networks (LANs). Traditionally in undergraduate courses, the design of a feedback circuit is cast in terms of a two-port analysis, since the closed-loop properties of the circuit are expressed in terms of the corresponding open-loop ones. Therefore, the designer can directly identify the proper feedback topology and adjust the amount of feedback based on the specified closed-loop performances. However, there are practical situations in which a two-port analysis may lead to incorrect results if applied inappropriately or cannot be applied at all. In this paper, the authors show how it is possible to achieve a better insight of these problems in the light of Blackman´s method. Moreover, after a derivation of the formula as a consequence of the superposition principle applied to a LAN, they discuss, with reference to some typical examples, the conditions that must be met for the correct application of the two-port method.
  • Keywords
    circuit feedback; educational courses; electric impedance; electrical engineering education; teaching; Blackman´s method; closed-loop properties; feedback circuits impedance evaluation; linear active networks; negative feedback; undergraduate courses; Circuit topology; FETs; Feedback circuits; Feedback loop; Impedance; Intelligent networks; Linear feedback control systems; Negative feedback; Network topology; Open loop systems;
  • fLanguage
    English
  • Journal_Title
    Education, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9359
  • Type

    jour

  • DOI
    10.1109/TE.2002.804400
  • Filename
    1049599