Title :
A single flux quantum shift register operating at 65 K
Author :
Forrester, M.G. ; Przybysz, J.X. ; Talvacchio, J. ; Kang, J. ; Davidson, A. ; Gavaler, J.R.
Author_Institution :
Sci. & Technol. Center, Westinghouse Electr. Corp., Pittsburgh, PA, USA
fDate :
6/1/1995 12:00:00 AM
Abstract :
We report the fabrication and quasi-static testing of a two-stage, high-temperature superconducting, Single Flux Quantum shift register. The five-junction circuit was fabricated using a single YBCO film, with step-edge grain boundary junctions. Storage of flux, and its motion in response to LOAD and SHIFT signals, was demonstrated at 65 K.<>
Keywords :
barium compounds; high-temperature superconductors; shift registers; superconducting device testing; superconducting logic circuits; yttrium compounds; 65 K; YBCO film; YBaCuO; fabrication; five-junction circuit; flux motion; flux storage; high-temperature superconductor; quasi-static testing; single flux quantum shift register; step-edge grain boundary junctions; two-stage device; Circuit testing; Digital circuits; Fabrication; High temperature superconductors; Josephson junctions; Shift registers; Superconducting films; Superconducting logic circuits; Superconducting photodetectors; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
