Title :
Single-Event Transients in Bipolar Linear Integrated Circuits
Author :
Buchner, Stephen ; McMorrow, Dale
Author_Institution :
QSS Group Inc, Lanham, MD
Abstract :
Single-event transients (SETs) in linear integrated circuits have caused anomalies in a number of spacecraft. The consequences of these anomalies have spurred efforts to better understand SETs, including the mechanisms responsible for their generation, the best approaches for testing, how data should be analyzed and presented, and approaches for mitigation
Keywords :
bipolar analogue integrated circuits; integrated circuit testing; radiation hardening (electronics); space vehicle electronics; SET; bipolar linear integrated circuits; data analysis; hardening; single-event transients; spacecraft; testing approaches; Analog circuits; Analog integrated circuits; CMOS technology; Linear circuits; Operational amplifiers; P-n junctions; Pulse amplifiers; Space vehicles; Voltage; Voltage-controlled oscillators; Heavy ions; linear circuits; pulsed laser; single-event transients (SETs);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2006.882497
