Title :
Single-Event Tolerant Latch Using Cascode-Voltage Switch Logic Gates
Author :
Casey, Megan C. ; Bhuva, Bharat L. ; Black, Jeff D. ; Massengill, Lloyd W. ; Amusan, Oluwole A. ; Witulski, Arthur F.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN
Abstract :
A new latch design using Cascode-Voltage Switch Logic gates is evaluated for single event (SE) environments. The latch design is based on the DICE latch design, but with CVSL gates. Calibrated 3D device models for an IBM 130 nm technology were used for mixed-mode simulations of the latch for SE evaluations. Simulation results show that the latch is immune to charge deposition on multiple nodes. The proposed design does require a 60% increase in area and double the power, but is faster than conventional DICE-based latch design
Keywords :
CMOS logic circuits; circuit simulation; flip-flops; logic design; logic gates; radiation hardening (electronics); semiconductor device models; 3D device models; CMOS; cascode-voltage switch logic gates; charge deposition; conventional DICE-based latch design; digital circuits; mixed-mode simulations; radiation hardening; sequential circuits; single-event tolerant latch; Circuit simulation; Digital circuits; Feedback; Latches; Logic design; Logic devices; Logic gates; Radiation hardening; Single event transient; Switches; CMOS; digital circuits; radiation hardening; sequential circuits; single-event;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2006.884970
