Title :
Discriminant waveletfaces and nearest feature classifiers for face recognition
Author :
Chien, Jen-Tzung ; Wu, Chia-Chen
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
fDate :
12/1/2002 12:00:00 AM
Abstract :
Feature extraction, discriminant analysis, and classification rules are three crucial issues for face recognition. We present hybrid approaches to handle three issues together. For feature extraction, we apply the multiresolution wavelet transform to extract the waveletface. We also perform the linear discriminant analysis on waveletfaces to reinforce discriminant power. During classification, the nearest feature plane (NFP) and nearest feature space (NFS) classifiers are explored for robust decisions in presence of wide facial variations. Their relationships to conventional nearest neighbor and nearest feature line classifiers are demonstrated. In the experiments, the discriminant waveletface incorporated with the NFS classifier achieves the best face recognition performance.
Keywords :
eigenvalues and eigenfunctions; face recognition; feature extraction; image classification; statistical analysis; wavelet transforms; classification rule; discriminant waveletfaces; experiments; face recognition; feature extraction; linear discriminant analysis; multiresolution wavelet transform; nearest feature classifiers; nearest feature line classifiers; nearest feature plane; nearest feature space; nearest neighbor classifiers; Authentication; Discrete wavelet transforms; Face detection; Face recognition; Feature extraction; Linear discriminant analysis; Nearest neighbor searches; Neural networks; Prototypes; Robustness;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2002.1114855