Title :
Simulation and design methodology for a 50-Gb/s multiplexer/demultiplexer package
Author :
Shan, Lei ; Meghelli, Mounir ; Kim, Joong-Ho ; Trewhella, Jean M. ; Oprysko, Modest M.
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
fDate :
5/1/2002 12:00:00 AM
Abstract :
A 50 Gb/s package for SiGe BiCMOS 4:1 multiplexer and 1:4 demultiplexer targeting SONET OC-768 serial communication systems is introduced in this work. The package was designed to facilitate bit-error-rate tests and constructed with high-speed coaxial connectors, transmission lines on ceramic substrate, ribbon bonds for chip-to-package interconnects, and a metal composite housing. Numerical simulations were conducted to guide the package design, and both small signal measurements and operational tests were performed thereafter to verify the design and modeling concepts. To keep the model structure under the existing computing capability, the simulation was segmented into three sections - coaxial connector to transmission line, transmission line alone, and transmission line to ribbon bond, and then the results were assembled to predict the performance of the entire package. The package was operated up to 50 Gb/s with low degradation to input digital waveforms and free of error.
Keywords :
BiCMOS digital integrated circuits; SONET; demultiplexing equipment; integrated circuit design; integrated circuit interconnections; integrated circuit measurement; integrated circuit packaging; multiplexing equipment; 50 Gbit/s; BiCMOS; SONET OC-768 serial communication systems; bit-error-rate tests; chip-to-package interconnects; coaxial connector to transmission line; high-speed coaxial connectors; input digital waveforms; metal composite housing; multiplexer/demultiplexer package; operational tests; package design; ribbon bonds; small signal measurements; transmission line to ribbon bond; transmission lines; Coaxial components; Connectors; Design methodology; Germanium silicon alloys; Multiplexing; Packaging; Predictive models; Signal design; Silicon germanium; Testing;
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/TADVP.2002.803268