• DocumentCode
    870497
  • Title

    Design and fabrication of an IC encapsulation mold adhesion force tester

  • Author

    Chang, Shyang-Jye ; Hwang, Sheng-Jye

  • Author_Institution
    Dept. of Mech. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    26
  • Issue
    4
  • fYear
    2003
  • Firstpage
    281
  • Lastpage
    285
  • Abstract
    In integrated circuit (IC) packaging, when epoxy molding compound (EMC) is filling the mold cavity and cured in the mold, adhesion occurs in the interface between EMC and mold surface. Too large an adhesion force can damage an IC and lower the yield rate. However, there was no report showing how to measure the mold adhesion force. This paper described the design and fabrication of an automatic EMC adhesion force test instrument that will measure adhesion force between mold surface and EMC. By measuring the adhesion force, one can judge how much does a specific type of surface treatment help in reducing the amount of mold adhesion force. One can also use this instrument to determine what parameters are important for reducing the magnitude of adhesion force between EMC and mold surface.
  • Keywords
    adhesion; encapsulation; integrated circuit packaging; moulding; EMC adhesion force; IC encapsulation; IC packaging; epoxy molding compound; integrated circuit; mold adhesion force; mold cavity; surface treatment; Adhesives; Circuit testing; Electromagnetic compatibility; Encapsulation; Fabrication; Force measurement; Instruments; Integrated circuit packaging; Integrated circuit testing; Surface treatment;
  • fLanguage
    English
  • Journal_Title
    Electronics Packaging Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-334X
  • Type

    jour

  • DOI
    10.1109/TEPM.2003.820821
  • Filename
    1262381