• DocumentCode
    870536
  • Title

    Processing and reliability of CSPs with underfill

  • Author

    Liu, Jing ; Johnson, R. Wayne ; Yaeger, Erin ; Konarski, Mark ; Crane, Larry

  • Author_Institution
    Lab. for Electron. Assembly & Packaging, Auburn Univ., AL, USA
  • Volume
    26
  • Issue
    4
  • fYear
    2003
  • Firstpage
    313
  • Lastpage
    319
  • Abstract
    The use of chip scale packages (CSPs) is rapidly expanding, particularly in portable electronic products. Many CSP designs will meet the thermal cycle or thermal shock requirements for these applications. However, mechanical shock and bending requirements often necessitate the use of underfills to increase the mechanical strength of the CSP-to-board connection. This paper examines the assembly process with capillary and fluxing underfills. Issues of solder paste versus flux only, solder flux residue cleaning and reworkability are investigated with the capillary flow underfills. Fluxing underfills eliminate the issues of flux-underfill compatibility, but require placement into a predispensed underfill. Voiding during placement is discussed. To evaluate the relative performance of the underfills, a drop test was performed and the results are presented. All of the underfills significantly (5-6x) improved the reliability in the drop test compared to nonunderfilled parts. Test vehicles were also subjected to liquid-to-liquid thermal shock testing. The use of underfill improved the thermal shock performance by ≥5x.
  • Keywords
    bending; chip scale packaging; integrated circuit reliability; integrated circuit testing; soldering; thermal shock; CSP-to-board connection; bending requirement; capillary underfill; chip scale packages; drop test reliability; fluxing underfill; liquid-to-liquid thermal shock testing; mechanical shock requirement; mechanical strength; portable electronic products; solder flux; solder paste; thermal cycle requirement; thermal shock requirement; underfills; Assembly; Chip scale packaging; Cleaning; Electric shock; Electronic packaging thermal management; Performance evaluation; Product design; Rapid thermal processing; Testing; Vehicles;
  • fLanguage
    English
  • Journal_Title
    Electronics Packaging Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-334X
  • Type

    jour

  • DOI
    10.1109/TEPM.2003.822082
  • Filename
    1262385