DocumentCode :
870542
Title :
Reliability of redundant integrated circuits in failure dependent application
Author :
Lawson, P.
Volume :
53
Issue :
5
fYear :
1965
fDate :
5/1/1965 12:00:00 AM
Firstpage :
505
Lastpage :
505
Keywords :
Application specific integrated circuits; Coupling circuits; Equations; Integrated circuit reliability; Redundancy; Silicon; Space missions; Space vehicles; Stress; Varactors;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1965.3846
Filename :
1445776
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=870542
