DocumentCode
870867
Title
Impact evaluation of the SOA spontaneous emission in ultrafast all-optical processing schemes
Author
Bogoni, A. ; Bizzi, A. ; Potì, L. ; Ghelfi, P.
Author_Institution
Laboratorio Nazionale di Reti Fotoniche, CNIT, Pisa, Italy
Volume
150
Issue
6
fYear
2003
Firstpage
548
Lastpage
551
Abstract
In ultrafast all-optical signal processing schemes based on nonlinear effects in SOAs, the impact of the device spontaneous emission noise is not negligible. Therefore a numerical extended model is developed in order to predict SOA noise behaviour. The proposed tool takes into account all the gain recovery dynamics, the current-induced gain saturation, and the gain spectrum dependence on the injected current. The noise spectrum at the output of the device is investigated as a function of the injected current and of the input power, and the numerical results are experimentally validated. The importance of the ASE introduction in the numerical analysis of the SOA-based schemes for ultrafast all-optical processing is demonstrated studying two particular applications. In particular, the effects of high detuning FWM and of XGM are analysed in the presence and absence of ASE noise.
Keywords
high-speed optical techniques; multiwave mixing; numerical analysis; optical noise; semiconductor device models; semiconductor device testing; semiconductor optical amplifiers; spontaneous emission; ASE introduction; FWM; SOA noise behaviour; SOA nonlinear effects; SOA spontaneous emission; SOA-based schemes; XGM; cross-gain modulation; current-induced gain saturation; four-wave mixing; gain recovery dynamics; gain spectrum injected current dependence; injected current; input power; numerical analysis; numerical extended model; output noise spectrum; spontaneous emission noise; ultrafast all-optical signal processing;
fLanguage
English
Journal_Title
Circuits, Devices and Systems, IEE Proceedings -
Publisher
iet
ISSN
1350-2409
Type
jour
DOI
10.1049/ip-cds:20031126
Filename
1262419
Link To Document