DocumentCode :
870905
Title :
Nonlinear forward problem solution for electrical capacitance tomography using feed-forward neural network
Author :
Marashdeh, Qussai ; Warsito, Warsito ; Fan, Liang-Shih ; Teixeira, Fernando L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
Volume :
6
Issue :
2
fYear :
2006
fDate :
4/1/2006 12:00:00 AM
Firstpage :
441
Lastpage :
449
Abstract :
A new technique for solving the forward problem in electrical capacitance tomography sensor systems is introduced. The new technique is based on training a feed-forward neural network (NN) to predict capacitance data from permittivity distributions. The capacitance data used in training and testing the NN is obtained from preprocessed and filtered experimental measurements. The new technique has shown better results when compared to the commonly used linear forward projection (LFP) while maintaining fast prediction speed. The new technique has also been integrated into a modified iterative linear back projection (Landweber) reconstruction algorithm. Reconstruction results are found to be in favor of the NN forward solver when compared to the widely used Landweber reconstruction technique with LFP forward solver.
Keywords :
data analysis; image reconstruction; iterative methods; learning (artificial intelligence); neural nets; prediction theory; tomography; Landweber reconstruction algorithm; capacitance data prediction; electrical capacitance tomography; feed-forward neural network; iterative linear back projection reconstruction algorithm; linear forward projection; neural network training; nonlinear forward problem solution; Capacitance measurement; Electrical capacitance tomography; Feedforward neural networks; Feedforward systems; Image reconstruction; Laboratories; Neural networks; Permittivity measurement; Reconstruction algorithms; Sensor systems; Electrical capacitance tomography (ECT); forward problem; iterative reconstruction; neural network (NN);
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2005.860316
Filename :
1608088
Link To Document :
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