• DocumentCode
    870933
  • Title

    Design and characterization of slit variable microgratings

  • Author

    Yan, Dong ; Lal, Amit

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
  • Volume
    6
  • Issue
    2
  • fYear
    2006
  • fDate
    4/1/2006 12:00:00 AM
  • Firstpage
    458
  • Lastpage
    464
  • Abstract
    This paper presents the design, modeling, fabrication, and characterization of two novel slit variable gratings using silicon-on-insulator (SOI) technology. These two electrostatic SOI-based slit variable gratings were named as serpentine shape grating (SSG) and bridge shape grating (BSG), respectively. The key components of SSG are a deformable serpentine-shaped beam interleaved with eight fixed cantilevers. The slit spacing of SSG is variable by electrostatically induced deformation of the serpentine-shaped beam. Electrostatically actuated BSG consists of 48 beams, acting as rulings, with different spring constants, varying periodically. The BSG grating can be adjusted due to different ruling displacements resulting from different spring constants. Using the finite element analysis (FEA) packages (ANSYS and Intellisuite), the two designs were optimized for a combination of large deflections at low actuation voltages. The optical beam propagation analysis was performed to demonstrate the optical performance of the microgratings using Rsoft. The preliminary electromechanical testing result proves that a 0.2-μm deflection is reached with the actuation voltage less than 3.5 V for both the two slit variable gratings, which shows good agreement with the FEA models. The two designs have the advantages of not requiring the bottom electrodes under the gratings to be segmented by comparison with existing slit variable gratings, and the extremely low actuation voltages present compatibility with the novel emerging SOI technology.
  • Keywords
    diffraction gratings; finite element analysis; micro-optics; optical deflectors; optimisation; silicon-on-insulator; 2 micron; bridge shape grating; electromechanical testing; electrostatic SOI-based slit variable gratings; electrostatic induced deformation; finite element analysis; optical beam propagation; optical modulators; serpentine shape grating; serpentine-shaped beam; silicon-on-insulator technology; slit spacing; spring constants; Bridge circuits; Electrostatics; Fabrication; Gratings; Low voltage; Optical beams; Shape; Silicon on insulator technology; Springs; Structural beams; Diffraction; electrostatic; finite element analysis (FEA); gratings; optical modulators; silicon-on-insulator (SOI);
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2006.870150
  • Filename
    1608090