Title :
SEL Induced Latent Damage, Testing, and Evaluation
Author :
Layton, Phil ; Kniffin, Scott ; Guertin, Steven ; Swift, Gary ; Buchner, Stephen
Author_Institution :
Maxwell Technol. Inc, San Diego, CA
Abstract :
We describe a methodology for evaluating and screening SEL susceptible devices for latent damage. Experimental data and modeling are presented to demonstrate the approach on actual devices
Keywords :
DRAM chips; integrated circuit modelling; integrated circuit testing; radiation effects; SDRAM; Single Event Latchup induced latent damage; Single Event Latchup testing; potential failure mode; screening SEL susceptible devices; Laboratories; Laser theory; Life testing; NASA; Performance evaluation; Production; Propulsion; SDRAM; Space technology; Temperature; Characterization; SEL; latent damage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2006.886235
