Title :
Designing circuits with partial scan
Author :
Agrawal, Vishwani D. ; Cheng, Kwang-Ting ; Johnson, Daniel D. ; Lin, Tonysheng
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
fDate :
4/1/1988 12:00:00 AM
Abstract :
In this scan design methodology, only selected faults are targeted for detection. These faults are those not detected by the designer´s functional vectors. The test generator decides exactly which flip-flops should be scanned using one of two methods. In the first method, all possible tests are generated for each target fault, and the set of tests requiring the fewest flip-flops is selected. In the second method, only one test is generated for each fault, and the use of flip-flops is avoided as much as possible during test generation. Examples of actual VLSI circuits show a savings of at least a 40% in full-scan overhead.<>
Keywords :
VLSI; automatic testing; integrated circuit testing; integrated logic circuits; logic testing; VLSI circuits; flip-flops; partial scan; scan design methodology; target fault; test generator; Automatic control; Automatic testing; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Flip-flops; Sequential analysis; Shift registers; Timing;
Journal_Title :
Design & Test of Computers, IEEE
