Title :
Real-world board test effectiveness
Author :
Schlotzhauer, Ed O.
Author_Institution :
Hewlett-Packard, Loveland, CO, USA
fDate :
4/1/1988 12:00:00 AM
Abstract :
In-circuit testing is commonly thought to be inefficient for a high level of quality control, and unable to match the high yields of functional testing. A quantitative study of 34,296 boards that represented the testing of 6,671,038 components reveals that in-circuit testing can produce high yields -96.9% in this case. The author looks at this study.<>
Keywords :
automatic testing; printed circuit testing; quality control; board testing; in-circuit testing; quantitative study; yields; Assembly; Automatic testing; Calibration; Fault detection; Feedback; Flow production systems; Quality control; Timing; Topology; Virtual manufacturing;
Journal_Title :
Design & Test of Computers, IEEE
