• DocumentCode
    871121
  • Title

    Real-world board test effectiveness

  • Author

    Schlotzhauer, Ed O.

  • Author_Institution
    Hewlett-Packard, Loveland, CO, USA
  • Volume
    5
  • Issue
    2
  • fYear
    1988
  • fDate
    4/1/1988 12:00:00 AM
  • Firstpage
    16
  • Lastpage
    23
  • Abstract
    In-circuit testing is commonly thought to be inefficient for a high level of quality control, and unable to match the high yields of functional testing. A quantitative study of 34,296 boards that represented the testing of 6,671,038 components reveals that in-circuit testing can produce high yields -96.9% in this case. The author looks at this study.<>
  • Keywords
    automatic testing; printed circuit testing; quality control; board testing; in-circuit testing; quantitative study; yields; Assembly; Automatic testing; Calibration; Fault detection; Feedback; Flow production systems; Quality control; Timing; Topology; Virtual manufacturing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.2033
  • Filename
    2033
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=871121