Title :
250-MHz advanced test systems
Author :
Gruodis, Algirdas J. ; Hoffman, Dale E.
Author_Institution :
IBM Gen. Technol., Hopewell Junction, NY, USA
fDate :
4/1/1988 12:00:00 AM
Abstract :
New generations of electronic chips bring with them the promise of more capacity, storage, and speed. They also bring new challenges to design, test and manufacturing. A look at a series of advanced test systems, how they were designed and why, sheds new light on this practical side of advanced technology. These test systems are the ATS series from IBM.<>
Keywords :
automatic test equipment; integrated circuit testing; 250-MHz; ATS; ATS-1; ATS-2; ATS-3; IBM; advanced test systems; electronic chips; Control systems; Design engineering; Electronic equipment testing; Logic arrays; Logic devices; Logic testing; Manufacturing; Phased arrays; Semiconductor device testing; System testing;
Journal_Title :
Design & Test of Computers, IEEE
