DocumentCode
871217
Title
250-MHz advanced test systems
Author
Gruodis, Algirdas J. ; Hoffman, Dale E.
Author_Institution
IBM Gen. Technol., Hopewell Junction, NY, USA
Volume
5
Issue
2
fYear
1988
fDate
4/1/1988 12:00:00 AM
Firstpage
24
Lastpage
35
Abstract
New generations of electronic chips bring with them the promise of more capacity, storage, and speed. They also bring new challenges to design, test and manufacturing. A look at a series of advanced test systems, how they were designed and why, sheds new light on this practical side of advanced technology. These test systems are the ATS series from IBM.<>
Keywords
automatic test equipment; integrated circuit testing; 250-MHz; ATS; ATS-1; ATS-2; ATS-3; IBM; advanced test systems; electronic chips; Control systems; Design engineering; Electronic equipment testing; Logic arrays; Logic devices; Logic testing; Manufacturing; Phased arrays; Semiconductor device testing; System testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/54.2034
Filename
2034
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