• DocumentCode
    871220
  • Title

    On the Analysis and Improvement of Yield for TWT Small-Signal Gain

  • Author

    Paoloni, Claudio

  • Author_Institution
    Dept. of Electron. Eng., Univ. of Rome Tor Vergata, Rome
  • Volume
    55
  • Issue
    10
  • fYear
    2008
  • Firstpage
    2774
  • Lastpage
    2778
  • Abstract
    Traveling-wave tube (TWT) performance is sensibly affected by fabrication tolerances. An accurate yield evaluation and comprehension of the factors that contribute to yield degradation is fundamental to avoid excess costs in the fabrication process. In this paper, a procedure to evaluate and improve the yield of multisection helix TWTs in the design phase will be proposed, assuming a small-signal gain performance goal as the design target. An extended set of fabrication parameters is considered to provide a reliable estimate of the manufacturing tolerance effect on the final result. The introduction of yield sensitivity histograms together with cathode voltage adjustment demonstrates a relevant TWT yield improvement, together with indications on which fabrication step requires higher accuracy.
  • Keywords
    cathodes; tolerance analysis; travelling wave tubes; TWT small-signal gain; accurate yield evaluation; cathode voltage adjustment; manufacturing tolerance effect; traveling-wave tube; yield sensitivity histogram; Cathodes; Costs; Degradation; Electron beams; Fabrication; Histograms; Manufacturing; Performance analysis; Performance gain; Voltage; Slow-wave structure; statistical analysis; tolerance; traveling-wave tube (TWT); yield;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2008.2003083
  • Filename
    4631387