DocumentCode
871220
Title
On the Analysis and Improvement of Yield for TWT Small-Signal Gain
Author
Paoloni, Claudio
Author_Institution
Dept. of Electron. Eng., Univ. of Rome Tor Vergata, Rome
Volume
55
Issue
10
fYear
2008
Firstpage
2774
Lastpage
2778
Abstract
Traveling-wave tube (TWT) performance is sensibly affected by fabrication tolerances. An accurate yield evaluation and comprehension of the factors that contribute to yield degradation is fundamental to avoid excess costs in the fabrication process. In this paper, a procedure to evaluate and improve the yield of multisection helix TWTs in the design phase will be proposed, assuming a small-signal gain performance goal as the design target. An extended set of fabrication parameters is considered to provide a reliable estimate of the manufacturing tolerance effect on the final result. The introduction of yield sensitivity histograms together with cathode voltage adjustment demonstrates a relevant TWT yield improvement, together with indications on which fabrication step requires higher accuracy.
Keywords
cathodes; tolerance analysis; travelling wave tubes; TWT small-signal gain; accurate yield evaluation; cathode voltage adjustment; manufacturing tolerance effect; traveling-wave tube; yield sensitivity histogram; Cathodes; Costs; Degradation; Electron beams; Fabrication; Histograms; Manufacturing; Performance analysis; Performance gain; Voltage; Slow-wave structure; statistical analysis; tolerance; traveling-wave tube (TWT); yield;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2008.2003083
Filename
4631387
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