SiSMA-a tool for efficient analysis of analog CMOS integrated circuits affected by device mismatch

In this paper a simulator for the statistical analysis of analog CMOS integrated circuits affected by technological tolerance effects, including device mismatch, is presented. The tool, able to perform dc, ac, and transient analyses, is based on a rigorous formulation of circuit equations starting from the modified nodal analysis and including random current sources to take into account technological tolerances. Statistical simulation of specific circuits shows that the simulator requires a simulation time several orders of magnitude lower than that required by Monte Carlo analysis, while ensuring a good accuracy.