• DocumentCode
    871315
  • Title

    SAND83-1541C Seeing through the Latch-Up Window

  • Author

    Coppage, F.N. ; Allen, D.J. ; Dressendorfer, P.V. ; Ochoa, A. ; Rauchfuss, J. ; Wrobel, T.F.

  • Author_Institution
    Sandia National Laboratories Albuquerque, New Mexico 87185
  • Volume
    30
  • Issue
    6
  • fYear
    1983
  • Firstpage
    4122
  • Lastpage
    4126
  • Abstract
    The observation of radiation-induced latch-up windows has caused doubt in the validity of accepted latch-up screens. Models giving a plausible explanation of latch-up windows are presented which show that they are only a special case of latch-up as explained by many investigators and can be treated accordingly. Furthermore, they are eliminated when latch-up is prevented by either neutron irradiation of the devices or utilization of epitaxial substrates.
  • Keywords
    Integrated circuit measurements; Inverters; Laboratories; Neutrons; Photoconductivity; Pulse measurements; Semiconductor device modeling; Semiconductor process modeling; Substrates; Thyristors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1983.4333093
  • Filename
    4333093
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=871315