Title :
The Effect of Negative Feedback on Single Event Transient Propagation in Digital Circuits
Author :
Narasimham, Balaji ; Bhuva, Bharat L. ; Holman, William T. ; Schrimpf, Ronald D. ; Massengill, Lloyd W. ; Witulski, Arthur F. ; Robinson, William H.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN
Abstract :
Propagation and attenuation of Single Event Transient (SET) pulses in combinational logic circuits are examined. A Miller feedback mechanism that affects the minimum pulse width needed for SET propagation in combinational logic circuits is identified. Analytical models that are commonly employed to predict the combinational Soft Error Rate (SER) of future integrated circuit (IC) technologies do not include this feedback effect. Inclusion of this effect increases the critical charge required for SET propagation through a combinational logic circuit by more than 30%. This feedback phenomenon reduces the estimated SER, which is sensitive to changes in critical charge, by more than 40%
Keywords :
CMOS logic circuits; circuit feedback; combinational circuits; error statistics; semiconductor device models; CMOS; Miller feedback mechanism; SER; combinational logic circuits; combinational soft error rate; critical charge; digital circuits; integrated circuit technologies; negative feedback; single event transient propagation; Analytical models; Attenuation; Combinational circuits; Digital circuits; Error analysis; Integrated circuit modeling; Integrated circuit technology; Negative feedback; Pulse circuits; Space vector pulse width modulation; Critical charge; Miller effect; SER; SET; feedback; single event; soft error;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2006.885380
