Title :
An ultra high speed test system
Author :
Henley, Francois J.
Author_Institution :
Photon Dynamics Inc., San Jose, CA, USA
Abstract :
The test-head subsystem presented uses gallium arsenide pin electronics to provide nonrepeating zero data rates up to 1.2 Gb/s. The device under test is connected to laser-scanned optical sensors, and the test system receivers use an electrooptic measurement method to capture the pin information. The receiver has a 4.5-GHz bandwidth and can perform functional test at the emitter-coupled logic level with one sampling pulse per vector. The device environment supports signals bandwidths near 5 GHz.<>
Keywords :
digital instrumentation; electro-optical devices; integrated circuit testing; 4.5 GHz; GaAs pin electronics; electrooptic measurement; emitter-coupled logic level; functional test; laser-scanned optical sensors; nonrepeating zero; test-head subsystem; ultra high speed test system; Bandwidth; Electronic equipment testing; Electrooptic devices; Gallium arsenide; Lasers and electrooptics; Logic testing; Optical receivers; Optical sensors; Performance evaluation; System testing;
Journal_Title :
Design & Test of Computers, IEEE
