Title :
A Survey of Aging of Electronics with Application to Nuclear Power Plant Instrumentation
Author :
Johnson, R.T., Jr. ; Thome, F.V. ; Craft, C.M.
Author_Institution :
Sandia National Laboratories Albuquerque, New Mexico 87185
Keywords :
Accelerometers; Aging; Instruments; Nuclear electronics; Power generation; Radiation effects; Resistors; Semiconductor devices; Testing; Transmitters;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1983.4333137
