Title :
Analytical Calculation of Jitter Probability Density at Multistage Output Buffers Due to Supply Voltage Fluctuations
Author :
Eunkyeong Park ; Hyungsoo Kim ; Jongjoo Shim ; Yong-Ju Kim ; Yun-Saing Kim ; Jingook Kim
Author_Institution :
Sch. of ECE, Ulsan Nat. Inst. of Sci. & Technol., Ulsan, South Korea
Abstract :
The jitter probability density function (PDF) at multistage output buffers due to supply voltage fluctuations is analytically derived. For experimental validation, an integrated circuit (IC) is designed, fabricated, and assembled in a printed circuit board (PCB). The on-chip supply voltage fluctuations are extracted from the simultaneous measurements at the pads on IC and PCB and used to calculate the jitter PDF of the multistage buffers. Also, characteristics of the output channels are measured and modeled with the separately designed channel pattern. Finally, the jitter PDFs for multistage buffers are calculated and compared with the measured jitter histograms.
Keywords :
buffer circuits; integrated circuit manufacture; jitter; printed circuits; probability; IC; PCB; channel pattern; integrated circuit; jitter PDF; jitter probability density analytical calculation; multistage output buffer; printed circuit board; voltage fluctuations; Integrated circuit modeling; Jitter; MOSFET; Probability density function; Voltage measurement; Clock tree; jitter; multistage; power distribution network (PDN); power-supply-induced jitter (PSIJ); probability density function (PDF); repeater; signal integrity;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2015.2403294
