DocumentCode
871896
Title
Unlimited High Breakdown Voltage by Natural Super Junction of Polarized Semiconductor
Author
Ishida, Hidetoshi ; Shibata, Daisuke ; Yanagihara, Manabu ; Uemoto, Yasuhiro ; Matsuo, Hisayoshi ; Ueda, Tetsuzo ; Tanaka, Tsuyoshi ; Ueda, Daisuke
Author_Institution
Semicond. Device Res. Center, Matsushita Electr. Ind. Co. Ltd., Kyoto
Volume
29
Issue
10
fYear
2008
Firstpage
1087
Lastpage
1089
Abstract
A breakdown mechanism of polarized semiconductors represented by GaN-based materials is presented, based on the concept of a natural super junction, which is established by the inherent material polarization. In this concept, owing to the precise matching of positive and negative polarizations of both sides of GaN and AlGaN materials, average charge concentration in the material becomes nearly zero under reverse bias condition, which realizes extremely high breakdown voltage. This model is confirmed by device simulation taking all polarization charges of GaN-based materials into account. Furthermore, experimentally fabricated GaN-based Schottky barrier diodes showed a linear increase of breakdown voltage along the anode-cathode spacing, achieving a record breakdown voltage over 9000 V.
Keywords
III-V semiconductors; Schottky diodes; aluminium compounds; electrochemical electrodes; gallium compounds; semiconductor device breakdown; semiconductor heterojunctions; wide band gap semiconductors; AlGaN-GaN; Schottky barrier diodes; anode-cathode spacing; breakdown voltage; charge concentration; natural super junction; polarized semiconductor; reverse bias condition; Electric breakdown; Gallium nitride; P-n junctions; Polarization; Semiconductor device breakdown; Semiconductor devices; Semiconductor diodes; Semiconductor impurities; Semiconductor materials; Silicon carbide; Breakdown voltage; GaN; Schottky barrier diode (SBD); heterojunction field-effect transistor (HFET); piezoelectric; polarization; simulation; super junction;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2008.2002753
Filename
4631459
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