• DocumentCode
    871951
  • Title

    Heavy-Ion Induced Single Event Upsets in a Bipolar Logic Device

  • Author

    Kolasinski, W.A. ; Koga, R. ; Chenette, D.L.

  • Author_Institution
    Space Sciences Laboratory the Aerospace Corporation P. O. Box 92957 Los Angeles, CA 90009
  • Volume
    30
  • Issue
    6
  • fYear
    1983
  • Firstpage
    4470
  • Lastpage
    4474
  • Abstract
    We present heavy ion test results for a bipolar logic device of moderate complexity. Such devices require the implementation of special techniques for testing circuits of varying upset sensitivity, and unlike similar MOS devices, present problems with test data interpretation.
  • Keywords
    Aerospace testing; Circuit analysis; Circuit testing; Clocks; Latches; Logic devices; Master-slave; Microprocessors; Semiconductor device measurement; Single event upset;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1983.4333156
  • Filename
    4333156
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=871951