• DocumentCode
    872001
  • Title

    Considerations for Single Event Immune VLSI Logic

  • Author

    Diehl, S.E. ; Vinson, J.E. ; Shafer, B.D. ; Mnich, T.M.

  • Author_Institution
    North Carolina State University Electrical and Computer Engineering Department P. O. Box 5275, Raleigh, North Carolina 27650
  • Volume
    30
  • Issue
    6
  • fYear
    1983
  • Firstpage
    4501
  • Lastpage
    4507
  • Keywords
    CMOS logic circuits; CMOS process; Computer errors; Laboratories; Latches; Logic arrays; Logic circuits; Random access memory; Very large scale integration; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1983.4333161
  • Filename
    4333161
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=872001