• DocumentCode
    872046
  • Title

    Single Event Upset (SEU) of Semiconductor Devices - A Summary of JPL Test Data

  • Author

    Nichols, Donald K. ; Price, William E. ; Malone, Carl J.

  • Author_Institution
    Jet Propulsion Laboratory California Institute of Technology Pasadena, California
  • Volume
    30
  • Issue
    6
  • fYear
    1983
  • Firstpage
    4520
  • Lastpage
    4525
  • Abstract
    A summary of the data on single event upset (bit flips) for sixt-y device types, having data storage elements, that were tested by JPL through May, 1982, is presented. The data were taken from fifteen accelerator tests with both protons and heavier ions.
  • Keywords
    Aerospace testing; Cyclotrons; Ion accelerators; Laboratories; Life estimation; Memory; Protons; Semiconductor device testing; Semiconductor devices; Single event upset;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1983.4333164
  • Filename
    4333164
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=872046