DocumentCode :
872244
Title :
Measurements of propagation delay time in transistors
Author :
Millard, J.K.
Volume :
53
Issue :
7
fYear :
1965
fDate :
7/1/1965 12:00:00 AM
Firstpage :
734
Lastpage :
735
Keywords :
Circuit testing; Delay effects; Dielectric measurements; Distributed parameter circuits; Oscilloscopes; Propagation delay; Sockets; Time measurement; Transmission line measurements; Transmission line theory;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1965.4006
Filename :
1445936
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=872244
