• DocumentCode
    872276
  • Title

    Proximity Effects in the Near-Field EMF Metrology

  • Author

    Dlugosz, Tomasz ; Trzaska, Hubert

  • Author_Institution
    Tech. Univ. of Wroclaw, Wroclaw
  • Volume
    58
  • Issue
    3
  • fYear
    2009
  • fDate
    3/1/2009 12:00:00 AM
  • Firstpage
    626
  • Lastpage
    630
  • Abstract
    This paper discusses the errors caused by multiple mirror reflections of an object calibrated (antenna) or exposed (animal and device) in a transverse electromagnetic cell. Although the effect may entirely be evident in the results of experiments performed with the use of the cell or similar devices, it has never been taken into account. Its role is of primary importance in biomedical investigations and may cause the experiments to be of qualitative, rather than quantitative, character.
  • Keywords
    TEM cells; electromagnetic fields; measurement; reflector antennas; biomedical investigations; multiple mirror reflections; near-field EMF metrology; object calibration; proximity effects; transverse electromagnetic cell; Bioeffects; electromagnetic field (EMF) measurements; exposure system; near field; standard EMF;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2008.2005276
  • Filename
    4631498