DocumentCode
872276
Title
Proximity Effects in the Near-Field EMF Metrology
Author
Dlugosz, Tomasz ; Trzaska, Hubert
Author_Institution
Tech. Univ. of Wroclaw, Wroclaw
Volume
58
Issue
3
fYear
2009
fDate
3/1/2009 12:00:00 AM
Firstpage
626
Lastpage
630
Abstract
This paper discusses the errors caused by multiple mirror reflections of an object calibrated (antenna) or exposed (animal and device) in a transverse electromagnetic cell. Although the effect may entirely be evident in the results of experiments performed with the use of the cell or similar devices, it has never been taken into account. Its role is of primary importance in biomedical investigations and may cause the experiments to be of qualitative, rather than quantitative, character.
Keywords
TEM cells; electromagnetic fields; measurement; reflector antennas; biomedical investigations; multiple mirror reflections; near-field EMF metrology; object calibration; proximity effects; transverse electromagnetic cell; Bioeffects; electromagnetic field (EMF) measurements; exposure system; near field; standard EMF;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2008.2005276
Filename
4631498
Link To Document