DocumentCode :
872401
Title :
Active thermal control of power electronic modules
Author :
Murdock, Dustin A. ; Torres, Jose E Ramos ; Connors, Jeffrey J. ; Lorenz, Robert D.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin, Madison, WI, USA
Volume :
42
Issue :
2
fYear :
2006
Firstpage :
552
Lastpage :
558
Abstract :
Active thermal control techniques make it feasible to regulate the steady state and transient thermal-mechanical stress in power electronic modules for applications such as motor drives. Online junction temperature estimation and manipulation of the switching frequency and current limit to regulate the losses are used to prevent overtemperature and power cycling failures in insulated gate bipolar transistor (IGBT) power modules. The techniques developed in this work are used to actively control the junction temperature of the power module. This control strategy improves power module reliability and increases utilization of the silicon thermal capacity by providing sustained operation at maximum attainable performance limits.
Keywords :
insulated gate bipolar transistors; power semiconductor switches; reliability; temperature control; IGBT power module reliability; active thermal control; insulated gate bipolar transistor; motor drives; online junction temperature estimation; overtemperature prevention; power cycling failures; power electronic modules; silicon thermal capacity; steady-state stress; switching frequency; transient thermal-mechanical stress; Frequency estimation; Insulated gate bipolar transistors; Motor drives; Multichip modules; Power electronics; Steady-state; Stress control; Switching frequency; Temperature; Thermal stresses; Active thermal control; loss control; operation in limits; power cycle control; reliability control;
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/TIA.2005.863905
Filename :
1608234
Link To Document :
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