DocumentCode :
872715
Title :
Scanning the issue
Author :
Siegel, Keeve M.
Volume :
53
Issue :
8
fYear :
1965
Firstpage :
769
Lastpage :
769
Abstract :
Provides an overview of the technical articles and features presented in this issue.
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1965.4052
Filename :
1445982
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=872715
