DocumentCode :
873006
Title :
Semiconductor Detectors and Double Beta Decay
Author :
Goulding, F.S. ; Landis, D.A. ; Luke, P.N. ; Madden, N.W. ; Malone, D.F. ; Pehl, R.H. ; Smith, A.R.
Author_Institution :
Lawrence Berkeley Laboratory University of California Berkeley, CA 94720 USA
Volume :
31
Issue :
1
fYear :
1984
Firstpage :
285
Lastpage :
299
Keywords :
Art; Detectors; Electron emission; Germanium; Laboratories; Neutrino sources; Neutrons; Protons; Radioactive decay; Shape measurement;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1984.4333263
Filename :
4333263
Link To Document :
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