• DocumentCode
    87301
  • Title

    Layered Exact-Repair Regenerating Codes via Embedded Error Correction and Block Designs

  • Author

    Chao Tian ; Sasidharan, Birenjith ; Aggarwal, Vaneet ; Vaishampayan, Vinay A. ; Kumar, P. Vijay

  • Author_Institution
    AT&T Labs. Res., Florham Park, NJ, USA
  • Volume
    61
  • Issue
    4
  • fYear
    2015
  • fDate
    Apr-15
  • Firstpage
    1933
  • Lastpage
    1947
  • Abstract
    A new class of exact-repair regenerating codes is constructed by stitching together shorter erasure correction codes, where the stitching pattern can be viewed as block designs. The proposed codes have the help-by-transfer property where the helper nodes simply transfer part of the stored data directly, without performing any computation. This embedded error correction structure makes the decoding process straightforward, and in some cases the complexity is very low. We show that this construction is able to achieve performance better than space-sharing between the minimum storage regenerating codes and the minimum repair-bandwidth regenerating codes, and it is the first class of codes to achieve this performance. In fact, it is shown that the proposed construction can achieve a nontrivial point on the optimal functional-repair tradeoff, and it is asymptotically optimal at high rate, i.e., it asymptotically approaches the minimum storage and the minimum repair-bandwidth simultaneously.
  • Keywords
    decoding; distributed memory systems; error correction codes; block designs; decoding process; embedded erasure correction codes; embedded error correction structure; help-by-transfer property; helper nodes; layered exact-repair regenerating codes; minimum repair-bandwidth regenerating codes; minimum storage regenerating codes; optimal functional-repair tradeoff; stitching pattern; Bandwidth; Bismuth; Educational institutions; Encoding; Maintenance engineering; Memory; Polynomials; Distributed storage; erasure codes;
  • fLanguage
    English
  • Journal_Title
    Information Theory, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9448
  • Type

    jour

  • DOI
    10.1109/TIT.2015.2408595
  • Filename
    7054531