Title :
Layered Exact-Repair Regenerating Codes via Embedded Error Correction and Block Designs
Author :
Chao Tian ; Sasidharan, Birenjith ; Aggarwal, Vaneet ; Vaishampayan, Vinay A. ; Kumar, P. Vijay
Author_Institution :
AT&T Labs. Res., Florham Park, NJ, USA
Abstract :
A new class of exact-repair regenerating codes is constructed by stitching together shorter erasure correction codes, where the stitching pattern can be viewed as block designs. The proposed codes have the help-by-transfer property where the helper nodes simply transfer part of the stored data directly, without performing any computation. This embedded error correction structure makes the decoding process straightforward, and in some cases the complexity is very low. We show that this construction is able to achieve performance better than space-sharing between the minimum storage regenerating codes and the minimum repair-bandwidth regenerating codes, and it is the first class of codes to achieve this performance. In fact, it is shown that the proposed construction can achieve a nontrivial point on the optimal functional-repair tradeoff, and it is asymptotically optimal at high rate, i.e., it asymptotically approaches the minimum storage and the minimum repair-bandwidth simultaneously.
Keywords :
decoding; distributed memory systems; error correction codes; block designs; decoding process; embedded erasure correction codes; embedded error correction structure; help-by-transfer property; helper nodes; layered exact-repair regenerating codes; minimum repair-bandwidth regenerating codes; minimum storage regenerating codes; optimal functional-repair tradeoff; stitching pattern; Bandwidth; Bismuth; Educational institutions; Encoding; Maintenance engineering; Memory; Polynomials; Distributed storage; erasure codes;
Journal_Title :
Information Theory, IEEE Transactions on
DOI :
10.1109/TIT.2015.2408595