DocumentCode :
873058
Title :
Hp Ge: Purification, Crystal Growth, and Annealing Properties
Author :
Hall, R.N.
Author_Institution :
Corporate Research and Development General Electric Company Schenectady, NY 12301
Volume :
31
Issue :
1
fYear :
1984
Firstpage :
320
Lastpage :
325
Abstract :
The prospects for growing HP Ge crystals of increased size and purity are examined. One interesting approach is to grow dislocation-free crystals, which must then be annealed to reduce the concentration of V2H traps. The phenomena which occur during annealing are discussed and compared with experiment. Hydrogen, present in atomic form at the growth temperature, forms H2 molecules during cooling, causing the effective diffusion coefficient to decrease rapidly. Models representing the reactions between H and the V2H, A(H, Si), and D(H, O) complexes are presented and analyzed.
Keywords :
Annealing; Crystalline materials; Crystals; Detectors; Furnaces; Germanium; Hydrogen; Impurities; Purification; Thermal stresses;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1984.4333268
Filename :
4333268
Link To Document :
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