DocumentCode :
873151
Title :
Noise contribution of the offset-gate i.g.f.e.t. with an additional gate electrode
Author :
Dill, H.G. ; Dill, H.G.
Author_Institution :
Swiss Federal Institute of Technology, Department of Advanced Electrical Engineering, Zurich, Switzerland
Volume :
3
Issue :
7
fYear :
1967
fDate :
7/1/1967 12:00:00 AM
Firstpage :
341
Lastpage :
342
Abstract :
The 1/f noise power of the offset-gate i.g.f.e.t. with an additional gate electrode (i.g.t.) is, under certain bias conditions, considerably lower in comparison to the full-gate i.g.f.e.t. of similar dimensions. This behaviour can be explained by a field dependent 1/f noise component from the pinchoff region. The i.g.t. allows the separation of the 1/f noise from the channel region and from the pinchoff region.
Keywords :
electron device noise; noise measurement; transistors;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19670261
Filename :
4207314
Link To Document :
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