DocumentCode :
873244
Title :
Current Status of the Micro Channel Plate
Author :
Matsuura, S. ; Umebayashi, S. ; Okuyama, C. ; Oba, Katsuya
Author_Institution :
Hamamatsu Photonics K.K. Ichino-cho, Hamamatsu, Japan
Volume :
31
Issue :
1
fYear :
1984
Firstpage :
399
Lastpage :
403
Abstract :
More than one order of improvement of the saturation effect was achieved by developing low resistance channel wall material and improved H2-reduction processing condition and introducing non-uniform resistance distribution along the channel. The nonuniform resistance distribution was also found to improve life problem because it can compensate the resistance change near the output end of the channel caused by electron bombardment.
Keywords :
Conductivity; Current measurement; Degradation; Electric resistance; Electron emission; Instruments; Nonuniform electric fields; Photonics; Testing; X-ray detection;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1984.4333286
Filename :
4333286
Link To Document :
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