DocumentCode :
873298
Title :
Limitations in determining absorbing-material parameters
Author :
Falkenbach, George J.
Author_Institution :
Battelle Memorial Institute, Columbus, Ohio
Volume :
53
Issue :
8
fYear :
1965
Firstpage :
1097
Lastpage :
1098
Abstract :
Different techniques can be used to evaluate the potential performance of radar-absorbing material (RAM). Transmission-line methods, which are based on distributed parameter measurements, are frequently used to determine its constitutive electromagnetic parameters--ε, µ and η, χ. The thin-sample and short-circuit-open-circuit (SCOC) techniques are most common in the UHF-SHF range. Although simple, the thin-sample method cannot always be used because of thickness limitations. The SCOC method, while relieving that limitation, suffers from others less understood. This paper discusses the considerations necessary in determining the parameters of RAM, and points out some limitations which must be recognized.
Keywords :
Coaxial components; Conductivity; Dielectric loss measurement; Dielectric materials; Electromagnetic measurements; Electromagnetic waveguides; Loss measurement; Magnetic materials; Plasma measurements; Shape measurement;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1965.4103
Filename :
1446033
Link To Document :
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