DocumentCode
873349
Title
A comparison of scattering model results for two-dimensional randomly rough surfaces
Author
Yang, Taiqian ; Broschat, Shira L.
Author_Institution
Sch. of Electr. Eng. & Comput. Sci., Washington State Univ., Pullman, WA, USA
Volume
40
Issue
12
fYear
1992
fDate
12/1/1992 12:00:00 AM
Firstpage
1505
Lastpage
1512
Abstract
Bistatic radar cross sections are calculated using two modern scattering models: the small slope approximation (both first- and second-order), and the phase perturbation technique. The problem is limited to scalar-wave scattering from two-dimensional, randomly rough Dirichlet surfaces with a Gaussian roughness spectrum. Numerical results for the cross sections are compared to those found using the classical Kirchhoff, or physical optics, approximation and perturbation theory. Over a wide range of scattering angles, the new results agree well with the classical results when the latter are considered to be accurate. A comparison between the new results shows that the phase perturbation method gives better results in the backscattering region for correlation lengths greater than approximately one wavelength, while both the first- and second-order small slope approximations yield greater accuracy in the forward scattering direction at low grazing angles
Keywords
approximation theory; backscatter; electromagnetic wave scattering; radar cross-sections; Dirichlet surfaces; Gaussian roughness spectrum; Kirchhoff approximation; backscattering region; bistatic radar cross-sections; electromagnetic scattering; forward scattering direction; low grazing angles; perturbation theory; phase perturbation technique; physical optics; scalar-wave scattering; scattering model; small slope approximation; two-dimensional randomly rough surfaces; Backscatter; Bistatic radar; Kirchhoff´s Law; Optical scattering; Optical surface waves; Perturbation methods; Radar scattering; Rough surfaces; Surface roughness; Surface waves;
fLanguage
English
Journal_Title
Antennas and Propagation, IEEE Transactions on
Publisher
ieee
ISSN
0018-926X
Type
jour
DOI
10.1109/8.204741
Filename
204741
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