DocumentCode :
87340
Title :
A Fully Monolithic 6H-SiC JFET-Based Transimpedance Amplifier for High-Temperature Capacitive Sensing
Author :
Chia-Wei Soong ; Garverick, Steven L. ; Xiao-An Fu ; Patil, A.C. ; Mehregany, Mehran
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Case Western Reserve Univ., Cleveland, OH, USA
Volume :
60
Issue :
12
fYear :
2013
fDate :
Dec. 2013
Firstpage :
4146
Lastpage :
4151
Abstract :
This paper introduces a high-temperature fully monolithic high gain-bandwidth 6H-SiC transimpedance amplifier for capacitive sensor interfacing. The amplifier achieves a gain of 235 kΩ and a bandwidth of 0.61 MHz at room temperature. Results from the proof-of-concept measurements performed with variable capacitors demonstrate the functionality of differential capacitive sensing across a wide temperature range, up to 450 °C. The amplifier also exhibits a stable gain with respect to power supply variations. At elevated temperatures, the amplifier exhibits increasing gain with decreasing bandwidth, as expected. At 450 °C, the gain and bandwidth are 774 kΩ and 0.17 MHz, respectively. This is the first report that demonstrates the capacitive sensing capability of a SiC transimpedance amplifier, and represents a critical step toward the goal of integrating a sensing element with its interface circuit in a single monolithic device for operation at extreme temperatures.
Keywords :
capacitive sensors; junction gate field effect transistors; monolithic integrated circuits; operational amplifiers; silicon compounds; wide band gap semiconductors; 6H-SiC transimpedance amplifier; SiC; bandwidth 0.61 MHz; capacitive sensor interfacing; frequency 0.17 MHz; high-temperature capacitive sensing; monolithic 6H-SiC JFET; resistance 235 kohm; resistance 774 kohm; temperature 450 C; variable capacitors; Capacitors; Frequency measurement; Gain measurement; Silicon carbide; Temperature measurement; Temperature sensors; Harsh environment; SiC; high temperature; junction gate field-effect transistor; transimpedance amplifier;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2013.2287601
Filename :
6658834
Link To Document :
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